P28_page_4

P28 | page 4 | https://thedailydialectics.com/pdfs/P28/P28.pdf

Characterization. SCW end-products were investigated by X-ray diffraction (XRD) measurement using a Siemens D5000 powder diffractometer. The instrumental broadening correction was determined from a SiO» standard reference material from Brucker. Pseudo- voigt peak profile analysis, using the Halder…